Browse "Graduate School of Nanoscience and Technology(나노과학기술대학원)" byAuthorYeo, Hogi

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Detecting defects with thermoelectricity at the atomic scale

Lee, Eui-Sup; Kim, Yong-Hyunresearcher; Yeo, Hogi; Cho, Sanghee, International Conference on Physics and Semiconductors (ICPS 2014), The University of TEXAS at Austin, 2014-08-12

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