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Inversion domain boundaries on tin (Sn)-doped ZnO nanobelts: Aberration-corrected scanning transmission electron microscopy study Park, Yun Chang; Kim, Young Heon; Nahm, Ho-Hyun; Noh, Ji-Young; Kim, Yong-Sung; Kim, Joondong; Lee, Won Seok; et al, APPLIED PHYSICS LETTERS, v.102, 2013-01 |
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