Showing results 1 to 1 of 1
In situ characterization of stoichiometry for the buried SiOx layers in SiOx/SiO2 superlattices and the effect on the photoluminescence property Kim, KJ; Moon, DW; Hong, SH; Choi, SH; Yang, MS; Jhe, JH; Shin, JungHoon, THIN SOLID FILMS, v.478, pp.21 - 24, 2005-05 |
Discover