실리콘 웨이퍼에서 변조된 광 반사율의 3차원적 해석The 3-dimensional analysis of photoreflectance in silicon wafers

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Advisors
남창희researcher김호철researcherNam, Chang-HeeresearcherKim, Ho-Chulresearcher
Description
한국과학기술원 : 물리학과,
Publisher
한국과학기술원
Issue Date
1995
Identifier
98549/325007 / 000835063
Language
kor
Description

학위논문(박사) - 한국과학기술원 : 물리학과, 1995.2, [ [ii], 75 p. ]

URI
http://hdl.handle.net/10203/47496
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=98549&flag=dissertation
Appears in Collection
PH-Theses_Ph.D.(박사논문)
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