An adaptive spatial filter for early depth test

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dc.contributor.authorYu, C.-H.ko
dc.contributor.authorKim, Lee-Supko
dc.date.accessioned2007-06-05T01:47:21Z-
dc.date.available2007-06-05T01:47:21Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2004-05-23-
dc.identifier.citation2004 IEEE International Symposium on Cirquits and Systems - Proceedings-
dc.identifier.issn0271-4310-
dc.identifier.urihttp://hdl.handle.net/10203/460-
dc.descriptionISCAS 2004en
dc.description.sponsorshipThis research was sponsored by SAMSUNG electronics and KOSEF through the MICROS at KAIST, Korea.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleAn adaptive spatial filter for early depth test-
dc.typeConference-
dc.identifier.wosid000223124000035-
dc.identifier.scopusid2-s2.0-4344718619-
dc.type.rimsCONF-
dc.citation.publicationname2004 IEEE International Symposium on Cirquits and Systems - Proceedings-
dc.identifier.conferencecountryCN-
dc.identifier.conferencelocationVancouver, BC-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Lee-Sup-
dc.contributor.nonIdAuthorYu, C.-H.-
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