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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| An Extremely Low Contact-Resistance MEMS Relay Using Meshed Drain Structure and Soft Insulating Layer Song, Yong-Ha; Choi, Dong-Hoon; Yang, Hyun-Ho; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.20, no.1, pp.204 - 212, 2011-02 | |
| A New Sensing Metric to Reduce Data Fluctuations in a Nanogap-Embedded Field-Effect Transistor Biosensor Kim, Chang-Hoon; Ahn, Jae-Hyuk; Lee, Kyung-Bok; Jung, Cheul-Hee; Park, Hyun-Gyu; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.59, no.10, pp.2825 - 2831, 2012-10 | |
| Detection of a Nanoscale Hot Spot by Hot Carriers in a Poly-Si TFT Using Polydiacetylene-Based Thermoresponsive Fluorometry Choi, Ji-Min; Choi, Sung-Jin; Yarimaga, Oktay; Yoon, Bora; Kim, Jong-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.5, pp.1570 - 1574, 2011-05 | |
| Charge trapping and breakdown mechanism in HfAIO/TaN gate stack analyzed using carrier separation Loh, WY; Cho, Byung Jin; Joo, MS; Li, MF; Chan, DSH; Mathew, S; Kwong, DL, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.4, no.4, pp.696 - 703, 2004-12 | |
| Improvement of Reliability of a Flexible Photoluminescent Display Using Organic-Based Materials Kim, Seung-Hun; Jang, Cheol; Kim, Kuk-Joo; Ahn, Sung-Il; Choi, Kyung-Cheol, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.57, pp.3370 - 3376, 2010-12 | |
| Transient bit error recovery scheme for ROM-based embedded systems Ryu, Sang-Moon; Park, Dong-Jo, IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, v.E88D, no.9, pp.2209 - 2212, 2005-09 | |
| Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides Ang, CH; Ling, CH; Cho, Byung Jin; Kim, SJ; Cheng, ZY, SOLID-STATE ELECTRONICS, v.44, no.11, pp.2001 - 2007, 2000-11 | |
| Hot carrier reliability study in body-tied fin-type field effect transistors Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.4B, pp.3101 - 3105, 2006-04 | |
| Bias and thermal annealings of radiation-induced leakage currents in thin-gate oxides Ang, CH; Ling, CH; Cheng, ZY; Kim, SJ; Cho, Byung Jin, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.47, no.6, pp.2764 - 4, 2000-12 | |
| RF, DC, and reliability characteristics of ALD HfO2-Al2O3 laminate MIM capacitors for Si RF IC applications Ding, SJ; Hu, H; Zhu, CX; Kim, SJ; Yu, XF; Li, MF; Cho, Byung Jin; Chan, DSH; Yu, MB; Rustagi, SC; Chin, A; Kwong, DL, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.51, no.6, pp.886 - 894, 2004-06 |
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