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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Blind Interference Alignment for a Class of K-user Line-of-Sight Interference Channels Chae, Sung-Ho; Chung, Sae-Young, IEEE TRANSACTIONS ON COMMUNICATIONS, v.60, no.5, pp.1177 - 1181, 2012-05 | |
| Strained Si/SiGe channel with buried Si0.99C0.01 for improved drivability, gate stack integrity and noise performance Loh, WY; Zang, H; Oh, HJ; Choi, KJ; Nguyen, HS; Lo, GQ; Cho, Byung Jin, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.54, pp.3292 - 3298, 2007-12 | |
| A comparative study of charge mobility measurements in a diamine and in a hexaazatrinaphthylene using different techniques Domercq, Benoit; Yu, Junsheng; Kaafarani, Bilal R.; Kondo, Takeshi; Yoo, Seunghyup; Haddock, Joshua N.; Barlow, Stephen; Marder, Seth R.; Kippelen, Bernard, MOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.481, pp.80 - 6, 2008 | |
| Channel mobility degradation and charge trapping in high-k/metal gate NMOSFETs Mathew, S; Bera, LK; Balasubramanian, N; Joo, MS; Cho, Byung Jin, THIN SOLID FILMS, v.462, pp.11 - 14, 2004-09 | |
| Moving elevator-cell system in indoor buildings Kim, TS; Cho, HS; Sung, Dan Keun, IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, v.49, no.5, pp.1743 - 1751, 2000-09 | |
| Dislocation effects in FinFETs for different III-V compound semiconductors Hur, Ji-Hyun; Jeon, Sanghun, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.49, no.15, 2016-04 | |
| Dislocation scatterings in p-type Si1-xGex under weak electric field Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.26, no.49, 2015-12 | |
| Determination of intrinsic mobility of a bilayer oxide thin-film transistor by pulsed I-V method Woo, Hyunsuk; Kim, Taeho; Hur, Jihyun; Jeon, Sanghun, NANOTECHNOLOGY, v.28, no.17, 2017-04 | |
| Influence of Fast Charging on Accuracy of Mobility in a-InHfZnO Thin-Film Transistor Kim, Taeho; Choi, Rino; Jeon, Sanghun, IEEE ELECTRON DEVICE LETTERS, v.38, no.2, pp.203 - 206, 2017-02 | |
| Mobility and traffic analyses in three-dimensional PCS environments Kim, TS; Chung, MY; Sung, Dan Keun, IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, v.47, no.2, pp.537 - 545, 1998-05 |
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