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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study Gupta, Dipti; Yoo, Seunghyup; Lee, Changhee; Hong, Yongtaek, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.7, pp.1995 - 2002, 2011-07 | |
Analysis of Transconductance (g(m)) in Schottky-Barrier MOSFETs Choi, Sung-Jin; Choi, Chel-Jong; Kim, Jee-Yeon; Jang, Moon-Gyu; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.2, pp.427 - 432, 2011-02 |
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