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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Microsecond Pulse I-V Approach to Understanding Defects in High Mobility Bi-layer Oxide Semiconductor Transistor Woo, Hyunsuk; Jeon, Sanghun, SCIENTIFIC REPORTS, v.7, 2017-08 | |
Determination of intrinsic mobility of a bilayer oxide thin-film transistor by pulsed I-V method Woo, Hyunsuk; Kim, Taeho; Hur, Jihyun; Jeon, Sanghun, NANOTECHNOLOGY, v.28, no.17, 2017-04 | |
Non-volatile resistive switching in CuBi-based conductive bridge random access memory device Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.112, no.25, 2018-06 |
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