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Results 1-2 of 2 (Search time: 0.004 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Pulse I-V characterization of a nanocrystalline oxide device with sub-gap density of states

Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.27, no.21, 2016-05

2
Quantitative analysis of charge trapping and classification of sub-gap states in MoS2 TFT by pulse I-V method

Park, Junghak; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.29, no.17, 2018-04

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