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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Characterization of intrinsic subgap density-of-states in exfoliated MoS2 FETs using a multi-frequency capacitance-conductance technique Bae, Hagyoul; Kim, Choong-Ki; Choi, Yang-Kyu, AIP ADVANCES, v.7, no.7, 2017-07 |
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