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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Transparent Semiconducting Oxide Technology for Touch Free Interactive Flexible Displays Lee, Sungsik; Jeon, Sanghun; Chaji, Reza; Nathan, Arokia, PROCEEDINGS OF THE IEEE, v.103, no.4, pp.644 - 664, 2015-04 | |
| A Sensor Array Using Multifunctional Field-effect Transistors with Ultrahigh Sensitivity and Precision for Bio-monitoring Kim, Do-Il; Tran Quang Trung; Hwang, Byeong-Ung; Kim, Jin-Su; Jeon, Sanghun; Bae, Jihyun; Park, Jong-Jin; Lee, Nae-Eung, SCIENTIFIC REPORTS, v.5, 2015-07 | |
| Hot Carrier Trapping Induced Negative Photoconductance in InAs Nanowires toward Novel Nonvolatile Memory Yang, Yiming; Peng, Xingyue; Kim, Hong-Seok; Kim, Taeho; Jeon, Sanghun; Kang, Hang Kyu; Choi, Wonjun; Song, Jindong; Doh, Yong-Joo; Yu, Dong, NANO LETTERS, v.15, no.9, pp.5875 - 5882, 2015-09 | |
| Thin Ion-Gel Dielectric Layer to Enhance the Stability of Polymer Transistors Lee, Sung Won; Shin, Minkwan; Park, Jae Yoon; Kim, Bong Soo; Tu, Deyu; Jeon, Sanghun; Jeong, Unyong, SCIENCE OF ADVANCED MATERIALS, v.7, no.5, pp.874 - 880, 2015-05 | |
| Fast transient charging behavior of HfInZnO thin-film transistor Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.107, no.9, 2015-08 | |
| Ar plasma treated ZnON transistor for future thin film electronics Lee, Eunha; Kim, Taeho; Benayad, Anass; Kim, HeeGoo; Jeon, Sanghun; Park, Gyeong-Su, APPLIED PHYSICS LETTERS, v.107, no.12, 2015-09 | |
| Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John, SCIENTIFIC REPORTS, v.5, 2015-10 | |
| Photoresponse of an oxide semiconductor photosensor Ahn, Seung-Eon; Park, Sungho; Kim, Taeho; Park, Junghak; Jeon, Sanghun, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.33, no.3, 2015-05 | |
| Dislocation scatterings in p-type Si1-xGex under weak electric field Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.26, no.49, 2015-12 | |
| A Monte Carlo simulation for bipolar resistive memory switching in large band-gap oxides Hur, Ji-Hyun; Lee, Dongsoo; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.107, no.20, 2015-11 |
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