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| Structure effects on resistive switching of Al/TiOx/Al devices for RRAM applications Yu, Lee-Eun; Kim, Sungho; Ryu, Min-Ki; Choi, Sung-Yool; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.29, no.4, pp.331 - 333, 2008-04 |
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