Browse "EE-Journal Papers(저널논문)" by Subject ultrathin oxide
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| Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides Ang, CH; Ling, CH; Cho, Byung Jin; Kim, SJ; Cheng, ZY, SOLID-STATE ELECTRONICS, v.44, no.11, pp.2001 - 2007, 2000-11 |
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