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First-Principles-Based Quantum Transport Simulations of Interfacial Point Defect Effects on InAs Nanowire Tunnel FETs Lee, Hyeongu; Cho, Yucheol; Jeon, Seonghyeok; Shin, Mincheol, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.11, pp.5901 - 5907, 2021-11 |
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