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| In-Depth Study on the Effect of Active-Area Scale-Down of Solution-Processed TiOx Jung, Seungjae; Kong, Jaemin; Kim, Tae-Wook; Song, Sunghoon; Lee, Kwanghee; Lee, Takhee; Hwang, Hyunsang; et al, IEEE ELECTRON DEVICE LETTERS, v.33, no.6, pp.869 - 871, 2012-06 |
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