Browse "EE-Journal Papers(저널논문)" by Subject parasitic source/drain (S/D) resistance
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| Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.27, no.6, pp.514 - 516, 2006-06 |
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