Browse "EE-Journal Papers(저널논문)" by Subject leakage current monitor
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| An autonomous SRAM with on-chip sensors in an 80-nm double stacked cell technology Sohn, K; Mo, HS; Suh, YH; Byun, HG; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.41, pp.823 - 830, 2006-04 |
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