Browse "EE-Journal Papers(저널논문)" by Subject hot-carrier effect

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Hot carrier reliability study in body-tied fin-type field effect transistors

Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.4B, pp.3101 - 3105, 2006-04

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