Browse "EE-Journal Papers(저널논문)" by Subject Trap-assisted tunneling (TAT)
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| Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12 |
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