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Browse "EE-Journal Papers(저널논문)" by Subject TFTS

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Showing results 1 to 8 of 8

1	Ar plasma treated ZnON transistor for future thin film electronics Lee, Eunha; Kim, Taeho; Benayad, Anass; Kim, HeeGoo; Jeon, Sanghun; Park, Gyeong-Su, APPLIED PHYSICS LETTERS, v.107, no.12, 2015-09
2	Bi-directional threshold voltage shift of amorphous InGaZnO thin film transistors under alternating bias stress Kim, Hyunjin; Kim, Beom Jung; Oh, Jungyeop; Choi, Sung-Yool; Park, Hamin, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.39, no.2, 2024-02
3	Defects and Charge-Trapping Mechanisms of Double-Active-Layer In-Zn-O and Al-Sn-Zn In-O Thin-Film Transistors Goh, Youngin; Kim, Taeho; Yang, Jong-Heon; Choi, Ji Hun; Hwang, Chi-Sun; Cho, Sung Haeng; Jeon, Sanghun, ACS APPLIED MATERIALS & INTERFACES, v.9, no.11, pp.9271 - 9279, 2017-03
4	Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study Gupta, Dipti; Yoo, Seunghyup; Lee, Changhee; Hong, Yongtaek, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.7, pp.1995 - 2002, 2011-07
5	Highly Manufacturable Device Isolation Technology Using Laser-Induced Epitaxial Growth for Monolithic Stack Devices Son, Yong-Hoon; Baik, Seung Jae; Jeon, Sanghun; Lee, Jong-Wook; Hwang, Gihyun; Shin, Yoo Gyun; Yoon, Euijoon, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.11, pp.3863 - 3868, 2011-11
6	Hybrid Gate Dielectric of MoS2 Transistors for Enhanced Photo-Electronic Stability Park, Hamin; Oh, Dong Sik; Hong, Woonggi; Kang, Juyeon; Lee, Geon-Beom; Shin, Gwang Hyuk; Choi, Yang-Kyu; et al, ADVANCED MATERIALS INTERFACES, v.8, no.14, pp.2100599, 2021-07
7	Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.11, 2010-09
8	Origin of High Photoconductive Gain in Fully Transparent Heterojunction Nanocrystalline Oxide Image Sensors and Interconnects Jeon, Sanghun; Song, Ihun; Lee, Sungsik; Ryu, Byungki; Ahn, Seung-Eon; Lee, Eunha; Kim, Young; et al, ADVANCED MATERIALS, v.26, no.41, pp.7102 - +, 2014-11

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