Browse "EE-Journal Papers(저널논문)" by Subject Positive bias illumination stress

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Turn-around of threshold voltage shift in amorphous InGaZnO TFT under positive bias illumination stress

Kim, Juwon; Kim, Hyunjin; Oh, Jungyeop; Choi, Sung-Yool; Park, Hamin, SOLID-STATE ELECTRONICS, v.201, 2023-03

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