Browse "EE-Journal Papers(저널논문)" by Subject Lithography modeling

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Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling

Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.35, no.3, pp.495 - 503, 2022-08

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