Browse "EE-Journal Papers(저널논문)" by Subject LEAKAGE CURRENTMODEL

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Curing of 1-Transistor-DRAM by Joule Heat From Punch-Through Current

Kim, Hyun-Jung; Lee, Geon-Beom; Han, Joon-Kyu; Han, Seong-Joo; Kim, Da-Jin; Yu, Ji-Man; Kim, Myung-Su; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.3, pp.370 - 373, 2022-03

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