Browse "EE-Journal Papers(저널논문)" by Author Yoo, Yong-Ho
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D3PointNet: Dual-Level Defect Detection PointNet for Solder Paste Printer in Surface Mount Technology Park, Jin-Man; Yoo, Yong-Ho; Kim, Ue-Hwan; Lee, Dukyoung; Kim, Jong-Hwan, IEEE ACCESS, v.8, pp.140310 - 140322, 2020-07 |
| Recurrent Reconstructive Network for Sequential Anomaly Detection Yoo, Yong-Ho; Kim, Ue-Hwan; Kim, Jong-Hwan, IEEE TRANSACTIONS ON CYBERNETICS, v.51, no.3, pp.1704 - 1715, 2021-03 |
| Spatio-Temporal Deformable DETR for Weakly Supervised Defect Localization Kim, Young-Min; Yoo, Yong-Ho; Yoon, In-Ug; Myung, Hyun; Kim, Jong-Hwan, IEEE SENSORS JOURNAL, v.23, no.17, pp.19935 - 19945, 2023-09 |
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