Showing results 1 to 4 of 4
Defects and Charge-Trapping Mechanisms of Double-Active-Layer In-Zn-O and Al-Sn-Zn In-O Thin-Film Transistors Goh, Youngin; Kim, Taeho; Yang, Jong-Heon; Choi, Ji Hun; Hwang, Chi-Sun; Cho, Sung Haeng; Jeon, Sanghun, ACS APPLIED MATERIALS & INTERFACES, v.9, no.11, pp.9271 - 9279, 2017-03 |
Double-Gate and Body-Contacted Nonvolatile Oxide Memory Thin-Film Transistors for Fast Erase Programming Yang, Jong-Heon; Byun, Chun-Won; Pi, Jae-Eun; Kim, Hee-Ok; Hwang, Chi-Sun; Yoo, Seunghyup, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.120 - 126, 2022-01 |
Highly stable Mo/Al bilayer electrode for stretchable electronics Choi, Ji Hun; Park, Chan Woo; Na, Bock Soon; Yang, Jong-Heon; Na, Jeho; Pi, Jae-Eun; Kim, Hee-Ok; et al, JOURNAL OF INFORMATION DISPLAY, v.24, no.2, pp.137 - 145, 2023-01 |
Thin-film transistor-driven vertically stacked full-color organic light-emitting diodes for high-resolution active-matrix displays Choi, Sukyung; Kang, Chan-mo; Byun, Chun-Won; Cho, Hyunsu; Kwon, Byoung-Hwa; Han, Jun-Han; Yang, Jong-Heon; et al, NATURE COMMUNICATIONS, v.11, no.1, 2020-06 |
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