Browse "EE-Journal Papers(저널논문)" by Author Valois, A.J.
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| TEMPERATURE DEPENDENCE OF THE I-V CHARACTERISTICS OF MODULATION-DOPED FETs. Valois, A.J.; Robinson, G.Y.; Lee, Kwyro; Shur, M.S., JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY B: MICROELECTRONICS AND NANOMETER STRUCTURES, v.1, no.2, pp.190 - 195, 1982-04 |
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