Browse "EE-Journal Papers(저널논문)" by Author Roh, Young Tak
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| Layout Modification of a PD-SOI n-MOSFET for Total Ionizing Dose Effect Hardening Roh, Young Tak; Lee, Hee Chul, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.1, pp.308 - 315, 2019-01 |
| Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07 |
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