Showing results 1 to 7 of 7
Amorphous Oxide Semiconductor TFTs for Displays and Imaging Nathan, Arokia; Lee, Sungsik; Jeon, Sanghun; Robertson, John, JOURNAL OF DISPLAY TECHNOLOGY, v.10, no.11, pp.917 - 927, 2014-11 |
Gated three-terminal device architecture to eliminate persistent photoconductivity in oxide semiconductor photosensor arrays Jeon, Sanghun; Ahn, Seung-Eon; Song, Ihun; Kim, Chang Jung; Chung, U-In; Lee, Eunha; Yoo, Inkyung; et al, NATURE MATERIALS, v.11, no.4, pp.301 - 305, 2012-04 |
Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.11, 2010-09 |
Origin of High Photoconductive Gain in Fully Transparent Heterojunction Nanocrystalline Oxide Image Sensors and Interconnects Jeon, Sanghun; Song, Ihun; Lee, Sungsik; Ryu, Byungki; Ahn, Seung-Eon; Lee, Eunha; Kim, Young; et al, ADVANCED MATERIALS, v.26, no.41, pp.7102 - +, 2014-11 |
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John, SCIENTIFIC REPORTS, v.5, 2015-10 |
Persistent photoconductivity in Hf-In-Zn-O thin film transistors Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.14, 2010-10 |
Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors Lee, Sungsik; Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Jeon, Sanghun; Kim, Changjung; Song, I-Hun; et al, APPLIED PHYSICS LETTERS, v.98, no.20, 2011-05 |
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