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Showing results 1 to 14 of 14

1
Bolometric properties of oxygen atmosphere annealed Nb:TiO2-x films for infrared detectors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.43, no.12, pp.9207 - 9213, 2017-08

2
Bolometric properties of reactively sputtered TiO2-x films for thermal infrared image sensors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.48, no.35, 2015-09

3
Effect of sputtering pressure on microstructure and bolometric properties of Nb: TiO2-x films for infrared image sensor applications

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF APPLIED PHYSICS, v.119, no.4, 2016-01

4
Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li

Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05

5
Enhanced bolometric properties of TiO2-x thin films by thermal annealing

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul; Reddy, P. Sreedhara, APPLIED PHYSICS LETTERS, v.107, no.2, 2015-07

6
Improvement of the thermal stability of Nb:TiO2-x samples for uncooled infrared detectors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.51, no.2, 2018-01

7
Influence of Nb Doping Concentration on Bolometric Properties of RF Magnetron Sputtered Nb:TiO2-x Films

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF ELECTRONIC MATERIALS, v.47, no.3, pp.2171 - 2176, 2018-03

8
Influence of passivation layer on thermal stability of Nb:TiO2-x samples for shutter-less infrared image sensors

Reddy, Y. Ashok Kumar; Ajitha, B.; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, INFRARED PHYSICS & TECHNOLOGY, v.100, pp.52 - 56, 2019-08

9
Nb doping effect on TiO2-x films for bolometer applications

Shin, Young Bong; Reddy, Y. Ashok Kumar; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.91, pp.128 - 135, 2016-04

10
Oxygen Atmosphere Annealing Effect on the Thermal Stability of TiO2-x Based Films for Shutter-Less Infrared Image Sensors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, Key Engineering Materials, v.775, pp.272 - 277, 2018-08

11
Oxygen partial pressure and thermal annealing dependent properties of RF magnetron sputtered TiO2-x films

Reddy, Y. Ashok Kumar; Kang, In-ku; Shin, Young Bong; Lee, Hee-Chul; Reddy, P. Sreedhara, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.32, pp.107 - 116, 2015-04

12
Sputtering pressure dependent bolometric properties of Ni1-xO thin films for uncooled bolometer applications

Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.43, no.12, pp.9498 - 9504, 2017-08

13
Substrate temperature dependent bolometric properties of TiO2-x films for infrared image sensor applications

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.42, no.15, pp.17123 - 17127, 2016-11

14
Systematic Investigation on Deposition Temperature Effect of Ni1-xO Thin Films for Uncooled Infrared Image Sensor Applications

Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.15, no.12, pp.7234 - 7241, 2015-12

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