Browse "EE-Journal Papers(저널논문)" by Author Reddy, P. Sreedhara

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1
Enhanced bolometric properties of TiO2-x thin films by thermal annealing

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul; Reddy, P. Sreedhara, APPLIED PHYSICS LETTERS, v.107, no.2, 2015-07

2
Oxygen partial pressure and thermal annealing dependent properties of RF magnetron sputtered TiO2-x films

Reddy, Y. Ashok Kumar; Kang, In-ku; Shin, Young Bong; Lee, Hee-Chul; Reddy, P. Sreedhara, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.32, pp.107 - 116, 2015-04

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