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Experimental Demonstration of Feature Extraction and Dimensionality Reduction Using Memristor Networks Choi, Shinhyun; Shin, Jong Hoon; Lee, Jihang; Sheridan, Patrick; Lu, Wei D., NANO LETTERS, v.17, no.5, pp.3113 - 3118, 2017-05 |
Retention failure analysis of metal-oxide based resistive memory Choi, Shinhyun; Lee, Jihang; Kim, Sungho; Lu, Wei D., APPLIED PHYSICS LETTERS, v.105, no.11, 2014-09 |
Tuning Resistive Switching Characteristics of Tantalum Oxide Memristors through Si Doping Kim, Sungho; Choi, ShinHyun; Lee, Jihang; Lu, Wei D., ACS NANO, v.8, no.10, pp.10262 - 10269, 2014-10 |
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