Browse "EE-Journal Papers(저널논문)" by Author Lee, Ho jun
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| The Effects of X-ray Irradiation-induced damage on Reliability in mos stuructures Kim, Shi-ho; Lee, Ho jun; Han, Chul-hi; Lee, Kwyro; Choi, Sang soo; Jeon, Young-jin; Fabrizio, Enzo Di; et al, Solid-State Electronics, 1994 |
| A skew-symmetroc cantilever accelermeter for automotive airbag application Kim, shi-ho; Lee, Ho jun; Han, Chul-hi; Lee, Kwyro; Choi, Sang soo, Sensors and Actuators A, Vol.50, pp.121-126, 1995 |
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