Browse "EE-Journal Papers(저널논문)" by Author LEE, KW
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| A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS Lee, Kwyro; SHUR, M; LEE, KW; VU, T; ROBERTS, P; HELIX, M, IEEE ELECTRON DEVICE LETTERS, v.5, no.1, pp.5 - 7, 1984 |
| SOURCE, DRAIN, AND GATE SERIES RESISTANCES AND ELECTRON SATURATION VELOCITY IN ION-IMPLANTED GAAS-FETS LEE, KW; Lee, Kwyro; SHUR, MS; VU, TT; ROBERTS, PCT; HELIX, MJ, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.32, no.5, pp.987 - 992, 1985 |
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