Browse "EE-Journal Papers(저널논문)" by Author LEE, H
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| FAULT-TOLERANT CONTROL WITH SWITCHING STRATEGY Bien, Zeung nam; LEE, H, INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE, v.24, no.5, pp.841 - 855, 1993-05 |
| THE EFFECTS OF X-RAY IRRADIATION-INDUCED DAMAGE ON RELIABILITY IN MOS STRUCTURES KIM, S; LEE, H; HAN, CH; Lee, Kwyro; CHOI, S; JEON, Y; DIFABRIZIO, E; et al, SOLID-STATE ELECTRONICS, v.38, no.1, pp.95 - 99, 1995-01 |
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