Browse "EE-Journal Papers(저널논문)" by Author Kim, Uehwan
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| Convolutional Recurrent Reconstructive Network for Spatiotemporal Anomaly Detection in Solder Paste Inspection Yoo, Yong Ho; Kim, Uehwan; Kim, Jong-Hwan, IEEE TRANSACTIONS ON CYBERNETICS, v.52, no.6, pp.4688 - 4700, 2022-06 |
| SimVODIS: Simultaneous Visual Odometry, Object Detection, and Instance Segmentation Kim, Uehwan; Kim, Se Ho; Kim, Jong-Hwan, IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.44, no.1, pp.428 - 441, 2022-01 |
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