Showing results 1 to 8 of 8
A 0.5-V Sub-10-mu W 15.28-m Omega/root Hz Bio-Impedance Sensor IC With Sub-1 degrees Phase Error Kim, Kwantae; Kim, Ji-Hoon; Gweon, Surin; Kim, Minseo; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.55, no.8, pp.2161 - 2173, 2020-08 |
A 1.4-m Omega-Sensitivity 94-dB Dynamic-Range Electrical Impedance Tomography SoC and 48-Channel Hub-SoC for 3-D Lung Ventilation Monitoring System Kim, Minseo; Jang, Jaeeun; Kim, Hyunki; Lee, Jihee; Lee, Jaehyuck; Lee, Ji-Won; Lee, Kyoung-Rog; et al, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.11, pp.2829 - 2842, 2017-11 |
A 23-mu W Keyword Spotting IC With Ring-Oscillator-Based Time-Domain Feature Extraction Kim, Kwantae; Gao, Chang; Graca, Rui; Kiselev, Ilya; Yoo, Hoi-Jun; Delbruck, Tobi; Liu, Shih-Chii, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.57, no.11, pp.3298 - 3311, 2022-11 |
A 55.77 mu W Bio-impedance Sensor with 276 mu s Settling Time for Portable Blood Pressure Monitoring System Kim, Kwantae; Kim, Minseo; Cho, Hyunwoo; Lee, Kwonjoon; Yoo, Hoi-Jun, JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.17, no.6, pp.912 - 919, 2017-12 |
An Ultra-low-power Mixed-mode Face Recognition Processor for Always-on User Authentication in Mobile Device Kim, Ji-Hoon; Kim, Changhyeon; Kim, Kwantae; Lee, Juhyoung; Yoo, Hoi-Jun; Kim, Joo-Young, JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.20, no.6, pp.499 - 509, 2020-12 |
Design of Sub-10-mu W Sub-0.1% THD Sinusoidal Current Generator IC for Bio-Impedance Sensing Kim, Kwantae; Kim, Sangyeob; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.57, no.2, pp.586 - 595, 2022-02 |
FlashMAC: A Time-Frequency Hybrid MAC Architecture With Variable Latency-Aware Scheduling for TinyML Systems Gweon, Surin; Kang, Sanghoon; Kim, Kwantae; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.57, no.10, pp.2944 - 2956, 2022-10 |
Neuro-CIM: ADC-Less Neuromorphic Computing-in-Memory Processor With Operation Gating/Stopping and Digital-Analog Networks Kim, Sangyeob; Kim, Sangjin; Um, Soyeon; Kim, Soyeon; Kim, Kwantae; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.58, no.10, pp.2931 - 2945, 2023-10 |
Discover