Browse "EE-Journal Papers(저널논문)" by Author Kang, Yesung
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| A Wide-Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology Node Kang, Yesung; Choi, Jaehyouk; Kim, Youngmin, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.62, no.9, pp.846 - 850, 2015-09 |
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