Browse "EE-Journal Papers(저널논문)" by Author Han, K
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| Derivation of drain current thermal noise for short-channel MOSFETs including the velocity saturation effect Han, K; Lee, Kwyro; Shin, H, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.44, pp.97 - 102, 2004-01 |
| The impact of semiconductor technology scaling on CMOS RF and digital circuits for wireless application Lee, Kwyro; Nam, I; Kwon, I; Gil, J; Han, K; Park, S; Seo, BL, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.52, pp.1415 - 1422, 2005-07 |
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