Browse "EE-Journal Papers(저널논문)" by Author Han, JW
Showing results 1 to 3 of 3
| Case studies on temperature-dependent characteristics in AC PDPs Shin, BJ; Choi, Kyung Cheol; Tae, HS; Seo, JH; Kim, JY; Han, JW, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.33, pp.162 - 169, 2005-02 |
| Hot carrier reliability study in body-tied fin-type field effect transistors Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.4B, pp.3101 - 3105, 2006-04 |
| Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.27, no.6, pp.514 - 516, 2006-06 |
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