Browse "EE-Journal Papers(저널논문)" by Author Ha, Man-Lyun

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New through-wafer via interconnections with thick oxidized porous silicon sidewall via

Kim, Bun-Joong; Ha, Man-Lyun; Kwon, Young Se, JAPANESE JOURNAL OF APPLIED PHYSICS, v.45, no.8A, pp.6141 - 6145, 2006

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