Browse "EE-Journal Papers(저널논문)" by Author HAN, LK
Showing results 1 to 4 of 4
| EFFECTS OF POST DEPOSITION ANNEALING ON THE ELECTRICAL-PROPERTIES AND RELIABILITY OF ULTRATHIN CHEMICAL-VAPOR-DEPOSITED TA2O5 FILMS HAN, LK; Yoon, Giwan; KWONG, DL; MATHEWS, VK; FAZAN, PC, IEEE ELECTRON DEVICE LETTERS, v.15, no.8, pp.280 - 282, 1994-08 |
| FORMATION OF HIGH-QUALITY STORAGE CAPACITOR DIELECTRICS BY IN-SITU RAPID THERMAL REOXIDATION OF SI3N4 FILMS IN N2O AMBIENT Yoon, Giwan; LO, GQ; KIM, J; HAN, LK; KWONG, DL, IEEE ELECTRON DEVICE LETTERS, v.15, no.8, pp.266 - 268, 1994-08 |
| FORMATION OF HIGH-QUALITY ULTRATHIN OXIDE NITRIDE (ON) STACKED CAPACITORS BY IN-SITU MULTIPLE RAPID THERMAL-PROCESSING HAN, LK; Yoon, Giwan; KIM, J; YAN, J; KWONG, DL, IEEE ELECTRON DEVICE LETTERS, v.16, no.8, pp.348 - 350, 1995-08 |
| MOS CHARACTERISTICS OF ULTRATHIN NO-GROWN OXYNITRIDES BHAT, M; KIM, J; YAN, J; Yoon, Giwan; HAN, LK; KWONG, DL, IEEE ELECTRON DEVICE LETTERS, v.15, no.10, pp.421 - 423, 1994-10 |
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