Browse "EE-Journal Papers(저널논문)" by Author Cho, Gangmin
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| Fast Optical Proximity Correction Using Graph Convolutional Network With Autoencoders Cho, Gangmin; Kim, Taeyoung; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.4, pp.629 - 635, 2023-11 |
| Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.35, no.3, pp.495 - 503, 2022-08 |
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