Browse "EE-Journal Papers(저널논문)" by Author Ahn, Hyun Jun
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| Temperature control for the gate workfunction engineering of TiC film by atomic layer deposition Kim, Choong-Ki; Ahn, Hyun Jun; Moon, Jung Min; Lee, Sukwon; Moon, Dong-Ii; Park, Jeong Soo; Cho, Byung-Jin; et al, SOLID-STATE ELECTRONICS, v.114, pp.90 - 93, 2015-12 |
| The Work Function Behavior of Aluminum-Doped Titanium Carbide Grown by Atomic Layer Deposition Moon, Jung Min; Ahn, Hyun Jun; Seo, Yujin; Lee, Tae In; Kim, Choong-Ki; Rho, Il Cheol; Kim, Choon Hwan; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.4, pp.1423 - 1427, 2016-04 |
| Very Low-Work-Function ALD-Erbium Carbide (ErC2) Metal Electrode on High-K Dielectrics Ahn, Hyun Jun; Moon, Jungmin; Koh, Sungho; Seo, Yujin; Kim, Choong-Ki; Rho, Il Cheol; Kim, Choon Hwan; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.7, pp.2858 - 2863, 2016-07 |
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