Browse "EE-Journal Papers(저널논문)" by Author Gentili, Massimo

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The Effects of X-ray Irradiation-induced damage on Reliability in mos stuructures

Kim, Shi-ho; Lee, Ho jun; Han, Chul-hi; Lee, Kwyro; Choi, Sang soo; Jeon, Young-jin; Fabrizio, Enzo Di; et al, Solid-State Electronics, 1994

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