Showing results 111 to 120 of 120
Tailoring of the coercive voltage in a ferroelectric polymer capacitor Kim, Woo-Young; Lee, Hee Chul, MICROELECTRONIC ENGINEERING, v.166, pp.19 - 25, 2016-12 |
THE EFFECT OF ELECTROCHEMICAL REDUCTION AND UV EXPOSURE IN H2S GAS ON INTERFACE PROPERTIES OF ZNS/P-HG1-XCDXTE JEONG, JH; Lee, Hee Chul; Kim, Choong Ki, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.31, no.12B, pp.1785 - 1787, 1992-12 |
Ti thickness effects in Pt/Ti bottom electrode on properties of (Ba,Sr)TiO3 thin film Cha, SY; Lee, SH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.16, no.1-4, pp.183 - 190, 1997 |
Time-based pixel-level ADC with wide dynamic range for 2-D LWIR applications Woo, DH; Hwang, CH; Lee, YS; Lee, Hee Chul, ELECTRONICS LETTERS, v.41, pp.782 - 783, 2005-07 |
Total Ionizing Dose Effects on a 12-bit 40kS/s SAR ADC Designed With a Dummy Gate-Assisted n-MOSFET Kim, Tae-Hyo; Lee, Hee Chul, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.64, no.1, pp.648 - 653, 2017-01 |
Triple-Mode Read-In Integrated Circuit for Infrared Sensor Evaluation System Cho, Min Ji; Woo, Doo Hyung; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.19, no.13, pp.5014 - 5021, 2019-07 |
Ultraviolet photon induced bulk, surface and interface modifications in n-Hg0.8Cd0.2Te in hydrogen environment Agnihotri, OP; Pal, R; Yang, KD; Bae, SH; Lee, SJ; Lee, MY; Choi, WS; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.7A, pp.4500 - 4502, 2002-07 |
Very Wide Dynamic Range ROIC With Pixel-Level ADC for SWIR FPAs Jo, Young Min; Woo, D. H.; Kang, S. G.; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.16, no.19, pp.7227 - 7233, 2016-10 |
X-ray diffraction and Raman scattering studies in B-10(+)-implanted Cd0.96Zn0.04Te thin films prepared by vacuum evaporation Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.14, pp.69 - 73, 2003-02 |
韓國 におけるHgCdTe技術 sooho bae; han jung; seung-man park; Lee, Hee Chul, JOURNAL OF THE JAPAN SOCIETY OF INFRARED SCIENCE AND TECHNOLOGY, v.18, no.2, pp.14 - 21, 2009-12 |
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