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Pattern-induced ripple structures at silicon-oxide/silicon interface by excimer laser irradiation Chen, XY; Lu, YF; Cho, Byung Jin; Zeng, YP; Zeng, JN; Wu, YH, APPLIED PHYSICS LETTERS, v.81, no.7, pp.1344 - 1346, 2002-08 |
Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon Zeng, YP; Lu, YF; Shen, ZX; Sun, WX; Yu, T; Liu, L; Zeng, JN; et al, NANOTECHNOLOGY, v.15, no.5, pp.658 - 662, 2004-05 |
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