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Loop-based inductance extraction and modeling for multiconductor on-chip interconnects Yu, S; Petranovic, DM; Krishnan, S; Lee, Kwyro; Yang, CY, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.53, pp.135 - 145, 2006-01 |
Picosecond time-domain characterization of CPW bends using a photoconductive near-field mapping probe Lee, J; Kim, J; Yu, S; Kim, Joungho, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.11, no.11, pp.453 - 455, 2001-11 |
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