Showing results 17 to 28 of 28
Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12 |
Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor Park, Jun-Young; Lee, Byung-Hyun; Lee, Geon-Beom; Bae, Hagyoul; Choi, Yang-Kyu, ACS APPLIED MATERIALS & INTERFACES, v.10, no.5, pp.4838 - 4843, 2018-02 |
Low-Frequency Noise Characteristics Under the OFF-State Stress Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.10, pp.4366 - 4371, 2020-10 |
Mimicry of Excitatory and Inhibitory Artificial Neuron with Leaky Integrate-and-Fire Function by a Single MOSFET Han, Joon-Kyu; Seo, Myungsoo; Kim, Wu-Kang; Kim, Moon-Seok; Kim, Seong-Yeon; Kim, Myung-Su; Yun, Gyeong-Jun; et al, IEEE ELECTRON DEVICE LETTERS, v.41, no.2, pp.208 - 211, 2020-02 |
Mnemonic-Opto-Synaptic Transistor for In-sensor Vision System Han, Joon-Kyu; Chung, Young-Woo; Sim, Jaeho; Yu, Ji-Man; Lee, Geon-Beom; Kim, Sang-Hyeon; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.12, no.1, 2022-02 |
Multi-functional logic circuits composed of ultra-thin electrolyte-gated transistors with wafer-scale integration Yu, Ji-Man; Lee, Chungryeol; Han, Joon-Kyu; Han, Seong-Joo; Lee, Geon-Beom; Im, Sung Gap; Choi, Yang-Kyu, JOURNAL OF MATERIALS CHEMISTRY C, v.9, no.22, pp.7222 - 7227, 2021-06 |
Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments Hwang, Kyu-Man; Park, Jun-Young; Bae, Hagyoul; Lee, Seung-Wook; Kim, Choong-Ki; Seo, Myungsoo; Im, Hwon; et al, ACS NANO, v.11, no.12, pp.12547 - 12552, 2017-12 |
Quantitative Analysis of Deuterium Annealing Effect on Poly-Si TFTs by Low Frequency Noise and DC I-V Characterization Kim, Dohyun; Lim, Sung Kwan; Bae, Hagyoul; Kim, Choong-Ki; Lee, Seung-Wook; Seo, Myungsoo; Kim, Seong-Yeon; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.4, pp.1640 - 1644, 2018-04 |
Reliability Improvement of Gate-All-Around SONOS Memory by Joule Heat From Gate-Induced Drain Leakage Current Lee, Jung-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Geon-Beom; Tcho, Il-Woong; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.115 - 119, 2022-01 |
Si-MoS2 Vertical Heterojunction for Photodetector with High Responsivity and Low Noise Equivalent Power Shin, Gwang Hyuk; Park, Jung Hoon; Lee, Khang June; Lee, Geon-Beom; Jeon, Hyun Bae; Choi, Yang-Kyu; Yu, Kyoungsik; et al, ACS APPLIED MATERIALS & INTERFACES, v.11, no.7, pp.7626 - 7634, 2019-01 |
Synaptic Segmented Transistor with Improved Linearity by Schottky Junctions and Accelerated Speed by Double-Layered Nitride Kim, Seong-Yeon; Yu, Ji-Man; Lee, Gi Sung; Yun, Dae-Hwan; Kim, Moon-Seok; Kim, Jin-Ki; Kim, Da-Jin; et al, ACS APPLIED MATERIALS & INTERFACES, v.14, no.28, pp.32261 - 32269, 2022-07 |
Ternary logic decoder using independently controlled double-gate Si-NW MOSFETs Han, Seong-Joo; Han, Joon-kyu; Kim, Myung-Su; Yun, Gyeong-Jun; Yu, Ji-Man; Tcho, Il-Woong; Seo, Myungsoo; et al, SCIENTIFIC REPORTS, v.11, no.1, pp.13018, 2021-06 |
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