Showing results 2 to 4 of 4
In-Depth Study on the Effect of Active-Area Scale-Down of Solution-Processed TiOx Jung, Seungjae; Kong, Jaemin; Kim, Tae-Wook; Song, Sunghoon; Lee, Kwanghee; Lee, Takhee; Hwang, Hyunsang; et al, IEEE ELECTRON DEVICE LETTERS, v.33, no.6, pp.869 - 871, 2012-06 |
Resistive switching characteristics of solution-processed TiOx for next-generation non-volatile memory application; transparency, flexibility, and nano-scale memory feasibility Jung, Seungjae; Kong, Jaemin; Song, Sunghoon; Lee, Kwanghee; Lee, Takhee; Hwang, Hyunsang; Jeon, Sanghun, MICROELECTRONIC ENGINEERING, v.88, no.7, pp.1143 - 1147, 2011-07 |
Resistive Switching Characteristics of Solution-Processed Transparent TiO(x) for Nonvolatile Memory Application Jung, Seungjae; Kong, Jaemin; Song, Sunghoon; Lee, Kwanghee; Lee, Takhee; Hwang, Hyunsang; Jeon, Sanghun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.157, no.11, pp.H1042 - H1045, 2010-09 |
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